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171Assessment Data Collection: Collecting Data from Instructors In certain cases, it is advantageous to use the data collection function of DU Assessment to collect assessment information from instructors. This quick start

Assessment Data Collection: Collecting Data from Instructors In certain cases, it is advantageous to use the data collection function of DU Assessment to collect assessment information from instructors. This quick start

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Source URL: assessment.du.edu

Language: English - Date: 2014-12-03 11:05:24
172Transferring your autosomal DNA results to other Databases • You can export raw data from your test results and import into a 3rd Party. – Increases your chances of finding a valuable match & provides alternative too

Transferring your autosomal DNA results to other Databases • You can export raw data from your test results and import into a 3rd Party. – Increases your chances of finding a valuable match & provides alternative too

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Source URL: www.2014.nyrgs.org

Language: English - Date: 2016-05-26 00:34:01
173DATA PRODUCT SPECIFICATION FOR LOCAL RANGE TEST Version 1-00 Document Control Number07-17

DATA PRODUCT SPECIFICATION FOR LOCAL RANGE TEST Version 1-00 Document Control Number07-17

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Source URL: oceanobservatories.org

Language: English - Date: 2015-11-16 09:14:57
174EVERYONE COUNTS: Using Citizen-generated data to monitor progress against the SDGs Everyone Counts is a multi-partner initiative to test the efficacy of social accountability at scale. Citizen-generated data, which will

EVERYONE COUNTS: Using Citizen-generated data to monitor progress against the SDGs Everyone Counts is a multi-partner initiative to test the efficacy of social accountability at scale. Citizen-generated data, which will

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Source URL: www.sexrightsafrica.net

Language: English - Date: 2016-07-29 04:41:41
175Fitting Power Law Distributions to Data Willy Lai Introduction In this paper, we will be testing whether the frequency of family names from the 2000 Census follow a power law distribution. Power law distributions are usu

Fitting Power Law Distributions to Data Willy Lai Introduction In this paper, we will be testing whether the frequency of family names from the 2000 Census follow a power law distribution. Power law distributions are usu

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Source URL: www.stat.berkeley.edu

Language: English - Date: 2012-05-03 16:56:38
176CONCRETE TEST CUBE DATA FORM.xlsx

CONCRETE TEST CUBE DATA FORM.xlsx

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Source URL: www.acsgroupofcompanies.co.uk

Language: English - Date: 2014-04-01 05:02:31
177DOI: j01584.x  Biometrics 67, 1330–1339 DecemberSmoothing Spline ANOVA Frailty Model for Recurrent Event Data

DOI: j01584.x Biometrics 67, 1330–1339 DecemberSmoothing Spline ANOVA Frailty Model for Recurrent Event Data

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Source URL: www.pstat.ucsb.edu

Language: English - Date: 2012-09-18 20:28:36
178Ethical Testing Guidelines and Acknowledgment Form Before administering end of course CTE Assessments, each teacher and/or proctor must read and sign the following ethics statement: Data collected from state-wide end of

Ethical Testing Guidelines and Acknowledgment Form Before administering end of course CTE Assessments, each teacher and/or proctor must read and sign the following ethics statement: Data collected from state-wide end of

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Source URL: www.arcteassessment.com

Language: English - Date: 2015-10-23 08:43:12
179Genome Informatics 11: 237–ALL/AML Cancer Classification by Gene Expression Data Using SVM and CSVM Approach∗

Genome Informatics 11: 237–ALL/AML Cancer Classification by Gene Expression Data Using SVM and CSVM Approach∗

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Source URL: www.jsbi.org

Language: English - Date: 2001-02-21 04:07:12
180Clean Data with a Wide Open Eye The world’s fastest logic series, the ECLinPS-Plus™ Logic Series from ON Semiconductor, also delivers telecommunications and networking designers a wide open eye pattern. In part, the

Clean Data with a Wide Open Eye The world’s fastest logic series, the ECLinPS-Plus™ Logic Series from ON Semiconductor, also delivers telecommunications and networking designers a wide open eye pattern. In part, the

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Source URL: www.steinwrites.com

Language: English - Date: 2009-03-19 17:34:20